| No. |
Part Name |
Description |
Manufacturer |
| 1 |
BD8374EFJ-M |
50V 500mA 1-Channel LED Source Driver for Automotive |
ROHM |
| 2 |
BD8374EFJ-ME2 |
50V 500mA 1-Channel LED Source Driver for Automotive |
ROHM |
| 3 |
BD8374HFP-M |
50V 500mA 1-Channel LED Source Driver for Automotive |
ROHM |
| 4 |
BD8374HFP-MTR |
50V 500mA 1-Channel LED Source Driver for Automotive |
ROHM |
| 5 |
NTE8374 |
Integrated Circuit Seven-Segment Latch/Decoder/Driver for Common Anode LED�s |
NTE Electronics |
| 6 |
PC8374L |
SensorPath SuperI/O with Glue Functions [Preliminary] |
National Semiconductor |
| 7 |
PC8374L0IBU/VLA |
SensorPath SuperI/O with Glue Functions [Preliminary] |
National Semiconductor |
| 8 |
PC8374L0IBW/VLA |
SensorPath SuperI/O with Glue Functions [Preliminary] |
National Semiconductor |
| 9 |
PC8374L_VLA |
3.0 V to 3.6 V, sensor parh super I/O with glue function |
National Semiconductor |
| 10 |
PC8374T |
SafeKeeper Desktop Trustedl/O |
National Semiconductor |
| 11 |
PC8374T_VLA |
3.0 V to 3.6 V, safe keeper desktop trusted I/O |
National Semiconductor |
| 12 |
SCAN18374T |
D-Type Flip-Flop with 3-STATE Outputs |
Fairchild Semiconductor |
| 13 |
SCAN18374T |
D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 14 |
SCAN18374TMDA |
D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 15 |
SCAN18374TSSC |
D Flip-Flop with 3-STATE Outputs |
Fairchild Semiconductor |
| 16 |
SCAN18374TSSCX |
D Flip-Flop with 3-STATE Outputs |
Fairchild Semiconductor |
| 17 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 18 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 19 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 20 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 21 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 22 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 23 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 24 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 25 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 26 |
TDA8374 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 27 |
TDA8374A |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 28 |
TDA8374AH |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 29 |
TDA8374AH_N3 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 30 |
TDA8374A_N1 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
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