| No. |
Part Name |
Description |
Manufacturer |
| 1 |
74ABT899 |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 2 |
74ABT899 |
9-Bit Latchable Transceiver with Parity Generator/Checker |
National Semiconductor |
| 3 |
74ABT899 |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
| 4 |
74ABT899A |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
| 5 |
74ABT899A |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
| 6 |
74ABT899CMSA |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 7 |
74ABT899CMSAX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 8 |
74ABT899CQC |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 9 |
74ABT899CQCX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 10 |
74ABT899CSC |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 11 |
74ABT899CSCX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
| 12 |
74ABT899D |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
| 13 |
74ABT899D |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
| 14 |
74ABT899DB |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
| 15 |
74ABT899DB |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
| 16 |
SN54ABT8952 |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 17 |
SN54ABT8952FK |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 18 |
SN54ABT8952JT |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
| 19 |
SN54ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 20 |
SN54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 21 |
SN54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
| 22 |
SN54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
Texas Instruments |
| 23 |
SN74ABT8952 |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
| 24 |
SN74ABT8952DL |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
| 25 |
SN74ABT8952DLR |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
| 26 |
SN74ABT8952DW |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
| 27 |
SN74ABT8952DWR |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
| 28 |
SN74ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 29 |
SN74ABT8996DW |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
| 30 |
SN74ABT8996DWR |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers |
Texas Instruments |
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