No. |
Part Name |
Description |
Manufacturer |
1 |
SN54BCT8373A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
2 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
3 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
4 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
5 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
6 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
7 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
8 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
9 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
10 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
11 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
12 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
13 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
14 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
15 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
16 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
17 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
18 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
19 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
20 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
21 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
22 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
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