| No. |
Part Name |
Description |
Manufacturer |
| 1 |
AB-059 |
MTTF, FAILRATE, RELIABILITY AND LIFE TESTING |
Burr Brown |
| 2 |
AB-104 |
DYNAMIC PERFORMANCE TESTING OF DIGITAL AUDIO D/A CONVERTERS |
Burr Brown |
| 3 |
AB-163 |
PARTIAL DISCHARGE TESTING: What It Is and What It Means |
Burr Brown |
| 4 |
AN1296 |
RING WAVE TESTS WITH ACS402/ACS108 DRIVING VALVES & PUMPS |
SGS Thomson Microelectronics |
| 5 |
DS21372 |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 6 |
DS21372T |
3.3V Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 7 |
DS21372T |
3.3V Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 8 |
DS21372T+ |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 9 |
DS21372TN |
3.3V Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 10 |
DS21372TN |
3.3V Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 11 |
DS21372TN+ |
3.3V Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 12 |
DS2172 |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 13 |
DS2172T |
Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 14 |
DS2172T |
Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 15 |
DS2172T+ |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 16 |
DS2172T+T&R |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 17 |
DS2172T/T&R |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 18 |
DS2172TN |
Bit Error Rate Tester (BERT) |
Dallas Semiconductor |
| 19 |
DS2172TN |
Bit Error Rate Tester BERT |
MAXIM - Dallas Semiconductor |
| 20 |
DS2172TN+ |
Bit Error Rate Tester (BERT) |
MAXIM - Dallas Semiconductor |
| 21 |
DS2174DK |
Enhanced Bit Error-Rate Tester Design Kit |
MAXIM - Dallas Semiconductor |
| 22 |
ERL |
Military/Established Reliability, MIL-PRF-39017 Qualified, Type RLR, Verified Failure Rate, Excellent High Frequency Performance, Epoxy Coating Provides Superior Moisture Protection, Monthly Lot Acceptance Testing, Very Low Noise |
Vishay |
| 23 |
PTF |
Industrial, Very Low Noise and Voltage Coefficient, Small Package, 100% Laser Spiraled, Very Good High Frequency Characteristics, Acceptance Testing Available, Can Replace Wirewound Bobbins, Superior Moisture Protection |
Vishay |
| 24 |
QUALITY |
Quality data - delivered product quality, random sample testing |
PLESSEY Semiconductors |
| | | |
