| No. |
Part Name |
Description |
Manufacturer |
| 61 |
5962-9571101QXA |
Negative Low Dropout Regulator |
National Semiconductor |
| 62 |
5962-9571101QXA |
Negative Low Dropout Regulator |
National Semiconductor |
| 63 |
5962-9681101QXA |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
| 64 |
5962-9751101Q2A |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
| 65 |
5962-9751101QHA |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
| 66 |
5962-9751101QPA |
Advanced LinCMOS(TM) Rail-To-Rail Output Wide-Input-Voltage Dual Operational Amplifier |
Texas Instruments |
| 67 |
5962-9861101Q2A |
Line Drivers |
Texas Instruments |
| 68 |
5962-9861101QCA |
Line Drivers |
Texas Instruments |
| 69 |
5962-9861101QDA |
Line Drivers |
Texas Instruments |
| 70 |
5962D0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 1E4(10krad(Si)). |
Aeroflex Circuit Technology |
| 71 |
5962D0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 1E4(10krad(Si)). |
Aeroflex Circuit Technology |
| 72 |
5962F9671101VXC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 73 |
5962F9671101VYC |
Radiation Hardened EDAC (Error Detection and Correction Circuit) |
Intersil |
| 74 |
5962L0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 5E4(50krad(Si)). |
Aeroflex Circuit Technology |
| 75 |
5962L0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 5E4(50krad(Si)). |
Aeroflex Circuit Technology |
| 76 |
5962P0151101QXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class Q. Total dose 3E4(30krad(Si)). |
Aeroflex Circuit Technology |
| 77 |
5962P0151101TXC |
512K32 16Megabit SRAM MCM: SDM. 25ns access time, 5.0V operation. Lead finish gold. QML class T. Total dose 3E4(30krad(Si)). |
Aeroflex Circuit Technology |
| 78 |
74AC11010 |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
| 79 |
74AC11010D |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
| 80 |
74AC11010DR |
Triple 3-Input Positive-NAND Gates 16-SOIC -40 to 85 |
Texas Instruments |
| 81 |
74AC11010N |
Triple 3-Input Positive-NAND Gates 16-PDIP -40 to 85 |
Texas Instruments |
| 82 |
74AC11011 |
TRIPLE 3-INPUT POSITIVE-AND GATES |
Texas Instruments |
| 83 |
74AC11011D |
Triple 3-Input Positive-AND Gates 16-SOIC -40 to 85 |
Texas Instruments |
| 84 |
74AC11011DR |
Triple 3-Input Positive-AND Gates 16-SOIC -40 to 85 |
Texas Instruments |
| 85 |
74AC11011N |
Triple 3-Input Positive-AND Gates 16-PDIP -40 to 85 |
Texas Instruments |
| 86 |
74AC11013 |
DUAL 4 INPUT NAND SCHMITT TRIGGER |
Philips |
| 87 |
74AC11013 |
Dual 4-Input Positive-NAND Gates With Schmitt-Trigger 14-PDIP -40 to 85 |
Texas Instruments |
| 88 |
74AC11013D |
DUAL 4 INPUT NAND SCHMITT TRIGGER |
Philips |
| 89 |
74AC11013D |
Dual 4-Input Positive-NAND Gates With Schmitt-Trigger 14-SOIC -40 to 85 |
Texas Instruments |
| 90 |
74AC11013N |
DUAL 4 INPUT NAND SCHMITT TRIGGER |
Philips |
| | | |
