No. |
Part Name |
Description |
Manufacturer |
1 |
8481A |
8481A Power Sensor, 10 MHz to 18 GHz |
Agilent (Hewlett-Packard) |
2 |
8481B |
8481B High Power Sensor, 10 MHz to 18 GHz, 25W |
Agilent (Hewlett-Packard) |
3 |
8481D |
8481D Diode Power Sensor, 10 MHz to 18 GHz |
Agilent (Hewlett-Packard) |
4 |
8481H |
8481H Power Sensor, 10 MHz to 18 GHz, 3W |
Agilent (Hewlett-Packard) |
5 |
AD9261 |
16-Bit, 10 MHz Bandwidth, 30 MSPS to 160 MSPS Continuous Time Sigma-Delta ADC |
Analog Devices |
6 |
ADC12181 |
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold |
National Semiconductor |
7 |
ADC12181CIVT |
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold |
National Semiconductor |
8 |
ADC12181EVAL |
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold |
National Semiconductor |
9 |
ADC12191 |
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold |
National Semiconductor |
10 |
ADC12191CIVT |
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold |
National Semiconductor |
11 |
ADL5801 |
High IP3, 10 MHz TO 6 GHz, Active Mixer |
Analog Devices |
12 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
13 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
14 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
15 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
16 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
23 |
AS91L1001S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
24 |
AS91L1001S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
25 |
AS91L1001S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
26 |
AS91L1001S-10F100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
27 |
AS91L1001S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
28 |
AS91L1001S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
29 |
AS91L1001S-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
30 |
AS91L1001S-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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