| No. |
Part Name |
Description |
Manufacturer |
| 1 |
ADS809 |
12-Bit/ 80MHz Sampling ANALOG-TO-DIGITAL CONVERTER |
Burr Brown |
| 2 |
ADS831 |
8-Bit, 80MHz Sampling ANALOG-TO-DIGITAL CONVERTER |
Burr Brown |
| 3 |
ADS831E |
8-Bit/ 80MHz Sampling ANALOG-TO-DIGITAL CONVERTER |
Burr Brown |
| 4 |
ADS831E_2K5 |
SpeedPlus 8-Bit, 80MHz Sampling Analog-to-Digital Converter |
Burr Brown |
| 5 |
EL4390 |
Triple 80MHz Video Amplifier with DC Restore |
Intersil |
| 6 |
EL4393 |
Triple 80MHz Video Amplifier w/Disable |
Intersil |
| 7 |
M65533FP |
3ch 8-bit 80MHz A/D Converters |
Mitsubishi Electric Corporation |
| 8 |
OPA358 |
3V Single Supply 80MHz High-Speed Op Amp in SC70 |
Texas Instruments |
| 9 |
OPA358AIDCKR |
3V Single Supply 80MHz High-Speed Op Amp in SC70 |
Texas Instruments |
| 10 |
OPA358AIDCKT |
3V Single Supply 80MHz High-Speed Op Amp in SC70 |
Texas Instruments |
| 11 |
OPA358AIDCKTG4 |
3V Single Supply 80MHz High-Speed Op Amp in SC70 6-SC70 -40 to 85 |
Texas Instruments |
| 12 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 13 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 14 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 15 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 16 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 17 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 18 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 19 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 20 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 21 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 22 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 23 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 24 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 25 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 26 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 27 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 28 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
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