No. |
Part Name |
Description |
Manufacturer |
1 |
A416316BS-40L |
64K X 16 CMOS DYNAMIC RAM WITH FAST PAGE MODE |
AMIC Technology |
2 |
A416316BV-40L |
64K X 16 CMOS DYNAMIC RAM WITH FAST PAGE MODE |
AMIC Technology |
3 |
A426316BS-40L |
64K X 16 CMOS DYNAMIC RAM WITH EDO PAGE MODE |
AMIC Technology |
4 |
A426316BV-40L |
64K X 16 CMOS DYNAMIC RAM WITH EDO PAGE MODE |
AMIC Technology |
5 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
6 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
7 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
8 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
9 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
10 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
11 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
12 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
13 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
14 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
15 |
AS91L1001E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
16 |
AS91L1001S-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1001S-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1001S-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1001S-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1001S-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1001S-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AS91L1001U-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
23 |
AS91L1001U-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
24 |
AS91L1001U-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
25 |
AS91L1001U-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
26 |
AS91L1001U-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
27 |
AS91L1001U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
28 |
AS91L1002BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
29 |
AS91L1002BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
30 |
AS91L1002BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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