| No. |
Part Name |
Description |
Manufacturer |
| 1 |
5962-9689401Q2A |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 2 |
5962-9689401QRA |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 3 |
ADC12441 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold |
National Semiconductor |
| 4 |
ADC12441883 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 5 |
ADC12441CIJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold [Life-time buy] |
National Semiconductor |
| 6 |
ADC12441CMJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 7 |
ADC12451 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold |
National Semiconductor |
| 8 |
ADC12451883 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 9 |
ADC12451CIJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold [Life-time buy] |
National Semiconductor |
| 10 |
ADC12451CMJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 11 |
HY27LF081G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 12 |
HY27LF161G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 13 |
HY27SF081G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 14 |
HY27SF161G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 15 |
HY27UF081G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 16 |
HY27UF161G2M-TES |
1Gbit (128Mx8bit / 64Mx16bit) NAND Flash Memory |
Hynix Semiconductor |
| 17 |
PD-AFAT-TESTER |
Accessories for PoE Systems |
Microsemi |
| 18 |
TLV1543 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 19 |
TLV1543CDB |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 20 |
TLV1543CDBG4 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. 20-SSOP -40 to 85 |
Texas Instruments |
| 21 |
TLV1543CDBLE |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 22 |
TLV1543CDBR |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 23 |
TLV1543CDBRG4 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. 20-SSOP |
Texas Instruments |
| 24 |
TLV1543CDW |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 25 |
TLV1543CDWG4 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. 20-SOIC |
Texas Instruments |
| 26 |
TLV1543CDWR |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 27 |
TLV1543CDWRG4 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. 20-SOIC |
Texas Instruments |
| 28 |
TLV1543CFN |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
| 29 |
TLV1543CFNG3 |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. 20-PLCC |
Texas Instruments |
| 30 |
TLV1543CFNR |
10-Bit 200 kSPS ADC Ser. Out, Built-In Self-Test Modes, Inherent S&H, Pin Compat. w/TLC1543, 11 Ch. |
Texas Instruments |
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