No. |
Part Name |
Description |
Manufacturer |
1 |
FDC2112-Q1 |
2-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
2 |
FDC2112QDNTRQ1 |
2-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
3 |
FDC2112QDNTTQ1 |
2-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
4 |
FDC2114-Q1 |
4-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
5 |
FDC2114QRGHRQ1 |
4-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
6 |
FDC2114QRGHTQ1 |
4-channel, Noise-immune, AEC-Q100 qualified, 12-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
7 |
FDC2212-Q1 |
2-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
8 |
FDC2212QDNTRQ1 |
2-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
9 |
FDC2212QDNTTQ1 |
2-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 12-WSON -40 to 125 |
Texas Instruments |
10 |
FDC2214-Q1 |
4-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
11 |
FDC2214QRGHRQ1 |
4-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
12 |
FDC2214QRGHTQ1 |
4-channel, Noise-immune, AEC-Q100 qualified, 28-bit Capacitive Sensing Solution 16-WQFN -40 to 125 |
Texas Instruments |
13 |
LDC1312-Q1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
14 |
LDC1312QDNTRQ1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
15 |
LDC1312QDNTTQ1 |
2-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
16 |
LDC1314-Q1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
17 |
LDC1314QRGHRQ1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
18 |
LDC1314QRGHTQ1 |
4-channel, AEC-Q100 qualified, 12-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
19 |
LDC1612-Q1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
20 |
LDC1612QDNTRQ1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
21 |
LDC1612QDNTTQ1 |
2-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 12-WSON -40 to 125 |
Texas Instruments |
22 |
LDC1614-Q1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
23 |
LDC1614QRGHRQ1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
24 |
LDC1614QRGHTQ1 |
4-channel, AEC-Q100 qualified, 28-bit Inductance-to-Digital Converter with I2C for Inductive Sensing 16-WQFN -40 to 125 |
Texas Instruments |
25 |
RCM, RCWPM, RCWM |
Military/Established Reliability MIL-R-55342/2/3/4/5/6/7/8/9/10 Qualified, Type RM, Verified Failure Rate, Variety of Termination Material, One-Surface and Wraparound Terminations |
Vishay |
26 |
SOCKET 940 |
AMD Socket 940 Qualification Plan |
Advanced Micro Devices |
| | | |