| No. |
Part Name |
Description |
Manufacturer |
| 1 |
381LQ103M025H032 |
105 C Compact, High-Ripple Snap-in |
etc |
| 2 |
381LQ123M025H042 |
105 C Compact, High-Ripple Snap-in |
etc |
| 3 |
381LQ153M025H452 |
105 C Compact, High-Ripple Snap-in |
etc |
| 4 |
381LQ183M025H052 |
105 C Compact, High-Ripple Snap-in |
etc |
| 5 |
381LQ682M025H012 |
105 C Compact, High-Ripple Snap-in |
etc |
| 6 |
381LQ822M025H022 |
105 C Compact, High-Ripple Snap-in |
etc |
| 7 |
489D226X025H32V |
Resin-Coated, Radial-Lead Solid Tantalum Capacitors |
Vishay |
| 8 |
MAX15025HATB+ |
Single/Dual, 16ns, High Sink/Source Current Gate Drivers |
MAXIM - Dallas Semiconductor |
| 9 |
PT5025H |
(-)15Vout 0.3A (+)5V-Input Positive To Negative ISR |
Texas Instruments |
| 10 |
R6021025HSYA |
1000V, 250A fast recovery single diode |
Powerex Power Semiconductors |
| 11 |
R6031025HSYA |
1000V, 250A fast recovery single diode |
Powerex Power Semiconductors |
| 12 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 13 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 14 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 15 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 16 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 17 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 18 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 19 |
TDA10025HN |
Dual cable demodulator |
NXP Semiconductors |
| 20 |
TDA8025HN |
Low voltage supply smart card interface |
NXP Semiconductors |
| | | |
