No. |
Part Name |
Description |
Manufacturer |
1 |
AS91L1003E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
2 |
AS91L1003E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3 |
AS91L1003E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
4 |
AS91L1003E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
5 |
AS91L1003E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
6 |
XC4003E-4PC84C |
Field programmable gate array. |
Xilinx |
7 |
XC4003E-4PC84I |
Field programmable gate array. |
Xilinx |
8 |
XC4003E-4PG120C |
Field programmable gate array. |
Xilinx |
9 |
XC4003E-4PG120I |
Field programmable gate array. |
Xilinx |
10 |
XC4003E-4PQ100C |
Field programmable gate array. |
Xilinx |
11 |
XC4003E-4PQ100I |
Field programmable gate array. |
Xilinx |
12 |
XC4003E-4VQ100C |
Field programmable gate array. |
Xilinx |
13 |
XC4003E-4VQ100I |
Field programmable gate array. |
Xilinx |
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