No. |
Part Name |
Description |
Manufacturer |
1 |
74LVTH18512DGGRE4 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85 |
Texas Instruments |
2 |
EXBU18512JX |
Resistor Network - Anti-Sulfurated Chip Resistor Array |
Panasonic |
3 |
HM62G18512 |
8M Synchronous Fast Static RAM(512k-word x 18-bit) |
Hitachi Semiconductor |
4 |
HM62G18512ABP |
Synchronous SRAMS |
Hitachi Semiconductor |
5 |
HM62G18512ABP-30 |
Memory>Fast SRAM>Late Write / High Speed Interface Synchronous SRAM |
Renesas |
6 |
HM62G18512ABP-33 |
Memory>Fast SRAM>Late Write / High Speed Interface Synchronous SRAM |
Renesas |
7 |
HM62G18512BP-4 |
8M Synchronous Fast Static RAM(512k-word x 18-bit) |
Hitachi Semiconductor |
8 |
HM62G18512BP-5 |
8M Synchronous Fast Static RAM(512k-word x 18-bit) |
Hitachi Semiconductor |
9 |
SN54LVT18512 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
10 |
SN54LVT18512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
11 |
SN54LVTH18512 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
12 |
SN54LVTH18512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
13 |
SN74LVT18512 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
14 |
SN74LVT18512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
15 |
SN74LVTH18512 |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
16 |
SN74LVTH18512DGGR |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
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