| No. |
Part Name |
Description |
Manufacturer |
| 1 |
IN74HC374ADW |
Octal 3-State Noninverting D Flip-Flop (High-Performance Silicon-Gate CMOS) |
INTEGRAL Semiconductor Devices |
| 2 |
IN74HCT374ADW |
Octal 3-state noninverting D flip-flop, high-performance silicon-gate CMOS |
INTEGRAL |
| 3 |
MC74HC374ADW |
Octal 3-State Noninverting D Flip-Flop |
Motorola |
| 4 |
MC74HC374ADW |
Octal D-Type Flip-Flop |
ON Semiconductor |
| 5 |
MC74HC374ADWR2 |
Octal D-Type Flip-Flop |
ON Semiconductor |
| 6 |
MC74HCT374ADW |
Octal 3-State Noninverting D Flip-Flop with LSTTL-Compatible Inputs |
Motorola |
| 7 |
MC74HCT374ADW |
Octal 3-State Non-Inverting Flip-Flop |
ON Semiconductor |
| 8 |
MC74HCT374ADWR2 |
Octal 3-State Non-Inverting Flip-Flop |
ON Semiconductor |
| 9 |
MC74VHCT374ADW |
Octal D-Type Flip-Flop with 3-State Output |
ON Semiconductor |
| 10 |
MC74VHCT374ADWR2 |
Octal D-Type Flip-Flop |
ON Semiconductor |
| 11 |
SN74ABT374ADW |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs |
Texas Instruments |
| 12 |
SN74ABT374ADWR |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs |
Texas Instruments |
| 13 |
SN74ABT374ADWRE4 |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs 20-SOIC -40 to 85 |
Texas Instruments |
| 14 |
SN74ABT374ADWRG4 |
Octal Edge-Triggered D-Type Flip-Flops with 3-State Outputs 20-SOIC -40 to 85 |
Texas Instruments |
| 15 |
SN74ALS374ADW |
Octal D-Type Edge Triggered Flip-Flops with 3-State Outputs |
Texas Instruments |
| 16 |
SN74ALS374ADWG4 |
Octal D-Type Edge Triggered Flip-Flops with 3-State Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 17 |
SN74ALS374ADWR |
Octal D-Type Edge Triggered Flip-Flops with 3-State Outputs |
Texas Instruments |
| 18 |
SN74ALS374ADWRE4 |
Octal D-Type Edge Triggered Flip-Flops with 3-State Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 19 |
SN74ALS374ADWRG4 |
Octal D-Type Edge Triggered Flip-Flops with 3-State Outputs 20-SOIC 0 to 70 |
Texas Instruments |
| 20 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 21 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 22 |
SN74LV374ADW |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 23 |
SN74LV374ADW |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 24 |
SN74LV374ADWG4 |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs 20-SOIC -40 to 125 |
Texas Instruments |
| 25 |
SN74LV374ADWR |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 26 |
SN74LV374ADWR |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 27 |
SN74LVC374ADW |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 28 |
SN74LVC374ADW |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
| 29 |
SN74LVC374ADWE4 |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs 20-SOIC -40 to 85 |
Texas Instruments |
| 30 |
SN74LVC374ADWR |
Octal Edge-Triggered D-Type Flip-Flops With 3-State Outputs |
Texas Instruments |
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