No. |
Part Name |
Description |
Manufacturer |
1 |
AS91L1003U-10F100-C |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
2 |
AS91L1003U-10F100-CF |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
3 |
AS91L1003U-10F100-CG |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
4 |
AS91L1003U-10F100-I |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
5 |
AS91L1003U-10F100-IG |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
6 |
AS91L1003U-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
7 |
AS91L1003U-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
8 |
AS91L1003U-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
9 |
AS91L1003U-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
10 |
AS91L1003U-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
11 |
AS91L1003U-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
12 |
AS91L1003U-40F100-CF |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
13 |
AS91L1003U-40F100-CG |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
14 |
AS91L1003U-40F100-IF |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
15 |
AS91L1003U-40F100-IG |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
16 |
AS91L1003U-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1003U-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1003U-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1003U-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1003U-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1003U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AT89C51CC03U-7CTIM |
Enhanced 8-bit MCU with CAN Controller and Flash Memory |
Atmel |
23 |
AT89C51CC03U-RDTIM |
Enhanced 8-bit MCU with CAN Controller and Flash Memory |
Atmel |
24 |
AT89C51CC03U-RLTIM |
Enhanced 8-bit MCU with CAN Controller and Flash Memory |
Atmel |
25 |
AT89C51CC03U-S3SIM |
Enhanced 8-bit MCU with CAN Controller and Flash Memory |
Atmel |
26 |
AT89C51CC03U-SLSIM |
Enhanced 8-bit MCU with CAN Controller and Flash Memory |
Atmel |
27 |
CAT25C03U-1.8TE13 |
1K/2K/4K/8K/16K SPI Serial CMOS EEPROM |
Catalyst Semiconductor |
28 |
CAT25C03U-TE13 |
1K/2K/4K/8K/16K SPI Serial CMOS EEPROM |
Catalyst Semiconductor |
29 |
CAT93C4613U-25TE13 |
1K 2.55-2.7V Supervisory circuit with microwire serial CMOS EEPROM, precision reset controller and watchdog timer |
Catalyst Semiconductor |
30 |
CAT93C4613U-28TE13 |
1K 2.85-3.0V Supervisory circuit with microwire serial CMOS EEPROM, precision reset controller and watchdog timer |
Catalyst Semiconductor |
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