| No. |
Part Name |
Description |
Manufacturer |
| 1 |
54FCT374APMQB |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 2 |
54FCT374APMQR |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 3 |
54FCT374APMX |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 4 |
74FCT374APMQB |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 5 |
74FCT374APMQR |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 6 |
74FCT374APMX |
Octal D Flip-Flop with TRI-STATE Outputs |
National Semiconductor |
| 7 |
74LVTH182504APMG4 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
| 8 |
MB90F574APMT |
16-bit Proprietary Microcontroller |
Fujitsu Microelectronics |
| 9 |
MB90F574APMT |
16-bit Proprietary Microcontroller |
Fujitsu Microelectronics |
| 10 |
MB91354APMT |
32-Bit Proprietary Microcontroller |
Fujitsu Microelectronics |
| 11 |
SN74ABTH182504APM |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 12 |
SN74ABTH18504APM |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 13 |
SN74ABTH18504APMR |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 14 |
SN74LVTH182504APM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 15 |
SN74LVTH18504APM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 16 |
SN74LVTH18504APMG4 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
| 17 |
SN74LVTH18504APMR |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 18 |
TL16CP554APM |
Quad UART with 16-Byte FIFOs 64-LQFP 0 to 70 |
Texas Instruments |
| | | |
