| No. |
Part Name |
Description |
Manufacturer |
| 1 |
28C256APM-1 |
High speed CMOS. 256K electrically erasable programmable ROM. 32K x 8 bit EEPROM. Access time 120 ns. |
Turbo IC |
| 2 |
28C256APM-1 |
High speed 120 ns CMOS 256 K electrically erasable programmable ROM 32K x 8 BIT EEPROM |
Turbo IC |
| 3 |
28C256APM-2 |
High speed CMOS. 256K electrically erasable programmable ROM. 32K x 8 bit EEPROM. Access time 150 ns. |
Turbo IC |
| 4 |
28C256APM-2 |
High speed 150 ns CMOS 256 K electrically erasable programmable ROM 32K x 8 BIT EEPROM |
Turbo IC |
| 5 |
28C256APM-3 |
High speed CMOS. 256K electrically erasable programmable ROM. 32K x 8 bit EEPROM. Access time 200 ns. |
Turbo IC |
| 6 |
28C256APM-3 |
High speed 200 ns CMOS 256 K electrically erasable programmable ROM 32K x 8 BIT EEPROM |
Turbo IC |
| 7 |
28C256APM-4 |
High speed 250 ns CMOS 256 K electrically erasable programmable ROM 32K x 8 BIT EEPROM |
Turbo IC |
| 8 |
28C256APM-4 |
High speed CMOS. 256K electrically erasable programmable ROM. 32K x 8 bit EEPROM. Access time 250 ns. |
Turbo IC |
| 9 |
GTLP6C816APMTC |
LVTTL-to-GTLP Clock Driver |
Fairchild Semiconductor |
| 10 |
GTLP6C816APMTCX |
LVTTL-to-GTLP Clock Driver |
Fairchild Semiconductor |
| 11 |
LM5056APMH/NOPB |
High Voltage System Power Measurement Device with PMBus 28-HTSSOP -40 to 125 |
Texas Instruments |
| 12 |
LM5056APMHE/NOPB |
High Voltage System Power Measurement Device with PMBus 28-HTSSOP -40 to 125 |
Texas Instruments |
| 13 |
LM5056APMHX/NOPB |
High Voltage System Power Measurement Device with PMBus 28-HTSSOP -40 to 125 |
Texas Instruments |
| 14 |
MB86606APMT2 |
FAST-20 SCSI Protocol Controller |
Fujitsu Microelectronics |
| 15 |
SN74ABTH182646APM |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 16 |
SN74ABTH18646APM |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 17 |
SN74LVTH182646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 18 |
SN74LVTH18646APM |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
| 19 |
SN74LVTH18646APMG4 |
3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85 |
Texas Instruments |
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