| No. |
Part Name |
Description |
Manufacturer |
| 1 |
SN54BCT8244A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 2 |
SN54BCT8244AFK |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 3 |
SN54BCT8244AJT |
SCAN TEST DEVICES WITH OCTAL BUFFERS |
Texas Instruments |
| 4 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 5 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 6 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 7 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 8 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 9 |
SNJ54BCT8244AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 10 |
SNJ54BCT8244AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| | | |
