No. |
Part Name |
Description |
Manufacturer |
1 |
KS8245A1 |
Single Darlington Transistor Module (15 Amperes/600 Volts) |
Powerex Power Semiconductors |
2 |
MPC8245ARZU400D |
Part Number Specification for the MPC8245ARZUnnnX Series |
Freescale (Motorola) |
3 |
MPC8245ARZU400D |
Part Number Specification for the MPC8245ARZUnnnX Series |
Freescale (Motorola) |
4 |
MPC8245ARZU400D |
400MHz; V(dd): -0.3 to +2.2V; integrated processor |
Motorola |
5 |
MPC8245ARZU466D |
Part Number Specification for the MPC8245ARZUnnnX Series |
Freescale (Motorola) |
6 |
MPC8245ARZU466D |
Part Number Specification for the MPC8245ARZUnnnX Series |
Freescale (Motorola) |
7 |
MPC8245ARZU466D |
466MHz; V(dd): -0.3 to +2.2V; integrated processor |
Motorola |
8 |
MPC8245ARZUPNS |
MPC8245 Part Number Specification for the MPC8245ARZUnnnX Series |
Motorola |
9 |
MPC8245ARZUPNS |
MPC8245 Part Number Specification for the MPC8245ARZUnnnX Series |
Motorola |
10 |
MPC8245RZU400D |
Part Number Specification for the MPC8245ARZUnnnX Series |
Freescale (Motorola) |
11 |
SN54ABT18245A |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
12 |
SN54ABT18245AWD |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
Texas Instruments |
13 |
SN54BCT8245A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
14 |
SN54BCT8245AJT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
15 |
SN54BCT8245ANT |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
16 |
SN74ABT18245A |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
17 |
SN74ABT18245ADGG |
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS |
Texas Instruments |
18 |
SN74ABT18245ADGGR |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
19 |
SN74ABT18245ADL |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
20 |
SN74ABT18245ADLR |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
21 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
22 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
23 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
24 |
SN74BCT8245AFK |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
Texas Instruments |
25 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
26 |
SNJ54ABT18245AWD |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
27 |
SNJ54BCT8245AFK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
28 |
SNJ54BCT8245AJT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
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