| No. |
Part Name |
Description |
Manufacturer |
| 1 |
1468373 |
Bobbin Type Inductors |
C&D Technologies |
| 2 |
BD83732HFP-M |
50V 500mA 1ch Source Driver for Automotive |
ROHM |
| 3 |
BD83732HFP-MTR |
50V 500mA 1ch Source Driver for Automotive |
ROHM |
| 4 |
BD83733HFP-M |
50V 500mA 1ch Source Driver for Automotive |
ROHM |
| 5 |
BD83733HFP-MTR |
50V 500mA 1ch Source Driver for Automotive |
ROHM |
| 6 |
CY28373 |
Universal Single Chip Clock Solution for SiS658 Pentium�4 |
Cypress |
| 7 |
G8373-01 |
InGaAs PIN photodiode |
Hamamatsu Corporation |
| 8 |
G8373-03 |
InGaAs PIN photodiode |
Hamamatsu Corporation |
| 9 |
SCAN18373T |
Transparent Latch with 3-STATE Outputs |
Fairchild Semiconductor |
| 10 |
SCAN18373T |
Transparent Latch with TRI-STATE Outputs |
National Semiconductor |
| 11 |
SCAN18373TMDA |
Transparent Latch with TRI-STATE Outputs |
National Semiconductor |
| 12 |
SCAN18373TSSC |
Transparent Latch with 3-STATE Outputs |
Fairchild Semiconductor |
| 13 |
SCAN18373TSSCX |
Transparent Latch with 3-STATE Outputs |
Fairchild Semiconductor |
| 14 |
SN54BCT8373A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 15 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 16 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 17 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 18 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 19 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 20 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 21 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 22 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 23 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 24 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 25 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 26 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 27 |
TDA8373 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 28 |
TDA8373C_N2 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 29 |
TDA8373C_N3 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 30 |
TDA8373N_N3 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| | | |
