| No. |
Part Name |
Description |
Manufacturer |
| 1 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 2 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 3 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 4 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 5 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 6 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 7 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 8 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 9 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 10 |
TDA8374A |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 11 |
TDA8374AH |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 12 |
TDA8374AH_N3 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 13 |
TDA8374A_N1 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 14 |
TDA8374A_N2 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| 15 |
TDA8374A_N3 |
I2C-bus controlled economy PAL/NTSC and NTSC TV-processors |
Philips |
| | | |
