| No. |
Part Name |
Description |
Manufacturer |
| 1 |
NCV8502PDW100 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 2 |
NCV8502PDW100R2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 3 |
NCV8502PDW25 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 4 |
NCV8502PDW25R2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 5 |
NCV8502PDW33 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 6 |
NCV8502PDW33R2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 7 |
NCV8502PDW50 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 8 |
NCV8502PDW50R2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 9 |
NCV8502PDW80 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 10 |
NCV8502PDW80R2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 11 |
NCV8502PDWADJ |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 12 |
NCV8502PDWADJR2 |
150 mA LDO Linear Regulators |
ON Semiconductor |
| 13 |
NDH8502P |
Dual P-Channel Enhancement Mode Field Effect Transistor |
Fairchild Semiconductor |
| 14 |
NDH8502P |
Dual P-Channel Enhancement Mode Field Effect Transistor |
National Semiconductor |
| 15 |
NDH8502P |
Dual P-Channel Enhancement Mode Field Effect Transistor |
National Semiconductor |
| 16 |
SN74ABT18502PM |
Scan Test Devices With 18-Bit Universal Bus Transceiver |
Texas Instruments |
| 17 |
SN74ABT18502PMR |
Scan Test Devices With 18-Bit Universal Bus Transceiver |
Texas Instruments |
| 18 |
SN74LVT18502PM |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
| | | |
