| No. |
Part Name |
Description |
Manufacturer |
| 1 |
NCV8504PW25 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 2 |
NCV8504PW25R2 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 3 |
NCV8504PW33 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 4 |
NCV8504PW33R2 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 5 |
NCV8504PW50 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 6 |
NCV8504PW50R2 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 7 |
NCV8504PWADJ |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 8 |
NCV8504PWADJR2 |
Micropower 400ma LDO Linear Regulators with DELAY, Adjustable /RESET, and General Use Comparator |
ON Semiconductor |
| 9 |
NDH8504P |
Dual P-Channel Enhancement Mode Field Effect Transistor [Not recommended for new designs] |
Fairchild Semiconductor |
| 10 |
NDH8504P |
Dual P-Channel Enhancement Mode Field Effect Transistor |
National Semiconductor |
| 11 |
SN74ABT18504PM |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 12 |
SN74ABT18504PMG4 |
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
| 13 |
SN74ABT18504PMR |
Scan Test Devices With 20-Bit Universal Bus Transceivers |
Texas Instruments |
| 14 |
SN74LVT18504PM |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 |
Texas Instruments |
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