No. |
Part Name |
Description |
Manufacturer |
1 |
2SJ591LS |
P-Channel Silicon MOSFET DC / DC Converter Applications |
SANYO |
2 |
54AC191L |
Up/Down Counter with Preset and Ripple Clock |
National Semiconductor |
3 |
54F191LM |
Up/Down Binary Counter with Preset and Ripple Clock |
National Semiconductor |
4 |
54F191LMQB |
Up/Down Binary Counter with Preset and Ripple Clock |
National Semiconductor |
5 |
54F191LMQB |
Up/Down Binary Counter with Preset and Ripple Clock |
National Semiconductor |
6 |
5962-89749012A(54AC191LMQB) |
4-Bit Up/Down Counter |
National Semiconductor |
7 |
5962-89749012A(54AC191LMQB) |
4-Bit Up/Down Counter |
National Semiconductor |
8 |
AM27PS191LC |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
9 |
AM27PS191LC-B |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
10 |
AM27PS191LCB |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
11 |
AM27PS191LCB-B |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
12 |
AM27S191LC |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
13 |
AM27S191LC-S |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
14 |
AM27S191LCB |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
15 |
AM27S191LCB-S |
16,384-bit (2048 x 8) bipolar PROM |
Advanced Micro Devices |
16 |
AP3891LFNTR-G1 |
ENHANCED MULTI-TOUCH CAPACITIVE TOUCH SCREEN CONTROLLER |
Diodes |
17 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
23 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
24 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
25 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
26 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
27 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
28 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
29 |
AS91L1001BU10F100C |
The AS91L1006BU is a one to 6-port JTAG gateway |
Alliance Semiconductor |
30 |
AS91L1001BU10F100C |
The AS91L1006BU is a one to 6-port JTAG gateway |
Alliance Semiconductor |
| | | |