| No. |
Part Name |
Description |
Manufacturer |
| 1 |
SN54BCT8240A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 2 |
SN54BCT8240AFK |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 3 |
SN54BCT8240AJT |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
Texas Instruments |
| 4 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 5 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 6 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 7 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 8 |
SNJ54BCT8240AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 9 |
SNJ54BCT8240AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| | | |
