No. |
Part Name |
Description |
Manufacturer |
1 |
74ABT899 |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
2 |
74ABT899 |
9-Bit Latchable Transceiver with Parity Generator/Checker |
National Semiconductor |
3 |
74ABT899 |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
4 |
74ABT899A |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
5 |
74ABT899A |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
6 |
74ABT899CMSA |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
7 |
74ABT899CMSAX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
8 |
74ABT899CQC |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
9 |
74ABT899CQCX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
10 |
74ABT899CSC |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
11 |
74ABT899CSCX |
9-Bit Latchable Transceiver with Parity Generator/Checker |
Fairchild Semiconductor |
12 |
74ABT899D |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
13 |
74ABT899D |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
14 |
74ABT899DB |
9-bit dual latch transceiver with 8-bit parity generator/checker (3-State) |
NXP Semiconductors |
15 |
74ABT899DB |
9-bit dual latch transceiver with 8-bit parity generator/checker 3-State |
Philips |
16 |
BT8954 |
Voice Pair Gain Framer |
Conexant |
17 |
BT8960 |
Single-Chip 2B1Q Transceiver |
Conexant |
18 |
BT8960EPF |
Single-chip 2BIQ transceiver |
Conexant |
19 |
BT8960EPF |
Single-Chip 2B1Q Transceiver |
Rockwell |
20 |
SN54ABT8952 |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
21 |
SN54ABT8952FK |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
22 |
SN54ABT8952JT |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
Texas Instruments |
23 |
SN54ABT8996 |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
24 |
SN54ABT8996FK |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
25 |
SN54ABT8996JT |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
Texas Instruments |
26 |
SN54ABT8996W |
10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
Texas Instruments |
27 |
SN74ABT8952 |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
28 |
SN74ABT8952DL |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
29 |
SN74ABT8952DLR |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
30 |
SN74ABT8952DW |
Scan Test Devices With Octal Registered Bus Transceivers |
Texas Instruments |
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