| No. |
Part Name |
Description |
Manufacturer |
| 1 |
ADC12451 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold |
National Semiconductor |
| 2 |
ADC12451883 |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 3 |
ADC12451CIJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample and Hold [Life-time buy] |
National Semiconductor |
| 4 |
ADC12451CMJ |
Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
National Semiconductor |
| 5 |
CY7C1245KV18-400BZC |
36-Mbit QDR� II+ SRAM Four-Word Burst Architecture (2.0 Cycle Read Latency) |
Cypress |
| 6 |
CY7C1245KV18-400BZXC |
36-Mbit QDR� II+ SRAM Four-Word Burst Architecture (2.0 Cycle Read Latency) |
Cypress |
| 7 |
CY7C1245KV18-400BZXI |
36-Mbit QDR� II+ SRAM Four-Word Burst Architecture (2.0 Cycle Read Latency) |
Cypress |
| 8 |
CY7C1245KV18-450BZC |
36-Mbit QDR� II+ SRAM Four-Word Burst Architecture (2.0 Cycle Read Latency) |
Cypress |
| 9 |
SPKC1245FL |
Schottky Diode |
Rectron Semiconductor |
| 10 |
UPC1245V |
FM IF system with differential peak detector |
NEC |
| | | |
