| No. |
Part Name |
Description |
Manufacturer |
| 1 |
28F008B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 2 |
28F008B3 |
SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE, 8-MBIT (1024K x 8), 16-MBIT (2056K x 8) FLASH MEMORY FAMILY |
Intel |
| 3 |
28F016B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 4 |
28F016B3 |
SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE, 8-MBIT (1024K x 8), 16-MBIT (2056K x 8) FLASH MEMORY FAMILY |
Intel |
| 5 |
28F032B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 6 |
28F160B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 7 |
28F320B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 8 |
28F400B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 9 |
28F800B3 |
SMART 3 ADVANCED BOOT BLOCK, 4-, 8-, 16-, 32-MBIT FLASH MEMORY FAMILY |
Intel |
| 10 |
ADM1021 |
The ADM1021 has been replaced by the ADM1021A |
Analog Devices |
| 11 |
AN1099 |
ST10-DSP MAC 06/07/1997 (OBSOLETE REPLACED BY AN1442) |
SGS Thomson Microelectronics |
| 12 |
AN1100 |
ST10X167/F168 REDUCING A TO D CONVERSION ERROR - 19/10/1998 (OBSOLETE, REPLACED BY AN1493) |
SGS Thomson Microelectronics |
| 13 |
BPW34B |
Silicon PIN Photodiode with Enhanced Blue Sensitivity |
Siemens |
| 14 |
BPX60 |
Silizium-Fotodiode mit erhohter Blauempfindlichkeit Silicon Photodiode with Enhanced Blue Sensitive |
Siemens |
| 15 |
BPX79 |
Silizium-Fotoelement mit erhohter Blauempfindlichkeit Silicon Photovoltaic Cell with Enhanced Blue Sensitivity |
Siemens |
| 16 |
BQ2023 |
Single-Wire Advanced Battery Monitor IC for Cellular and PDA Applications |
Texas Instruments |
| 17 |
BQ2023PW |
Single-Wire Advanced Battery Monitor IC for Cellular and PDA Applications |
Texas Instruments |
| 18 |
BQ2023PWG4 |
Single-Wire Advanced Battery Monitor IC for Cellular and PDA Applications 8-TSSOP -20 to 70 |
Texas Instruments |
| 19 |
BQ2023PWR |
Single-Wire Advanced Battery Monitor IC for Cellular and PDA Applications |
Texas Instruments |
| 20 |
DS2174DK |
Enhanced Bit Error-Rate Tester Design Kit |
MAXIM - Dallas Semiconductor |
| 21 |
GE28F008B3BA90 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 22 |
GE28F008B3TA90 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 23 |
GE28F160B3BC70 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 24 |
GE28F160B3BC80 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 25 |
GE28F160B3TC70 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 26 |
GE28F160B3TC80 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 27 |
GE28F320B3BC70 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 28 |
GE28F320B3BC90 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 29 |
GE28F320B3TC70 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
| 30 |
GE28F320B3TC90 |
3 Volt Advanced Boot Block Flash Memory |
Intel |
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