| No. |
Part Name |
Description |
Manufacturer |
| 1 |
LTC3632 |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 2 |
LTC3632EDD#PBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 3 |
LTC3632EDD#TRPBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 4 |
LTC3632EMS8E#PBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 5 |
LTC3632EMS8E#TRPBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 6 |
LTC3632IDD#PBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 7 |
LTC3632IDD#TRPBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 8 |
LTC3632IMS8E#PBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 9 |
LTC3632IMS8E#TRPBF |
High Efficiency, High Voltage 20mA Synchronous Step-Down Converter |
Linear Technology |
| 10 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 11 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 12 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 13 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 14 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 15 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 16 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 17 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 18 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 19 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 20 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 21 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 22 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| | | |
