No. |
Part Name |
Description |
Manufacturer |
1 |
1032E-100LJ |
High-Density Programmable Logic |
Lattice Semiconductor |
2 |
1032E-100LT |
High-Density Programmable Logic |
Lattice Semiconductor |
3 |
A-402E-10 |
Common anode hi.effi red dual digit display |
PARA Light |
4 |
A-502E-10 |
DUAL DIGITS DISPLAY |
PARA Light |
5 |
A-562E-10 |
Common anode hi.effi red dual digit display |
PARA Light |
6 |
A63L73321E-10 |
10ns 128K x 32bit synchronous high speed SRAM |
AMIC Technology |
7 |
A67L73321E-10 |
256K X 16/18/ 128K X 32/36 LVTTL/ Flow-through DBA SRAM |
AMIC Technology |
8 |
A67L73361E-10 |
256K X 16/18/ 128K X 32/36 LVTTL/ Flow-through DBA SRAM |
AMIC Technology |
9 |
A67L83161E-10 |
256K X 16/18/ 128K X 32/36 LVTTL/ Flow-through DBA SRAM |
AMIC Technology |
10 |
A67L83181E-10 |
256K X 16/18/ 128K X 32/36 LVTTL/ Flow-through DBA SRAM |
AMIC Technology |
11 |
ADE-10MH |
Frequency Mixer |
Mini-Circuits |
12 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
13 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
14 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
15 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
16 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1002E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1002E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1002E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1002E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1002E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AS91L1003E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
23 |
AS91L1003E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
24 |
AS91L1003E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
25 |
AS91L1003E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
26 |
AS91L1003E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
27 |
AS91L1006E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
28 |
AS91L1006E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
29 |
AS91L1006E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
30 |
AS91L1006E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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