No. |
Part Name |
Description |
Manufacturer |
1 |
1CE-402 |
Operating Considerations for RCA Solid State Devices - Application Note |
RCA Solid State |
2 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
4 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
5 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
6 |
AS91L1001E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
7 |
AS91L1002E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
8 |
AS91L1002E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
9 |
AS91L1002E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
10 |
AS91L1002E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
11 |
AS91L1002E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
12 |
AS91L1003E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
13 |
AS91L1003E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
14 |
AS91L1003E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
15 |
AS91L1003E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
16 |
AS91L1003E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1006E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1006E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1006E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1006E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1006E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
DF12E-40DP-0.5V |
0.5mm Pitch SMT Board to Board Connector |
Hirose Electric |
23 |
DF12E-40DS-0.5V |
0.5mm Pitch SMT Board to Board Connector |
Hirose Electric |
24 |
DF18E-40DP-0.4V |
0.4mm Contact Pitch, 1.5mm above the board, Board-to-Board / Board-to-FPC Connectors |
Hirose Electric |
25 |
DF18E-40DS-0.4V |
0.4mm Contact Pitch, 1.5mm above the board, Board-to-Board / Board-to-FPC Connectors |
Hirose Electric |
26 |
DS1110E-400 |
10-Tap Silicon Delay Line |
MAXIM - Dallas Semiconductor |
27 |
DS1110E-400+ |
10-Tap Silicon Delay Line |
MAXIM - Dallas Semiconductor |
28 |
DS1110LE-400 |
3V 10-Tap Silicon Delay Line |
MAXIM - Dallas Semiconductor |
29 |
GLT4160L04E-40J3 |
40ns; 4M x 4 CMOS dynamic RAM with extended data output |
G-LINK Technology |
30 |
GLT4160L04E-40TC |
40ns; 4M x 4 CMOS dynamic RAM with extended data output |
G-LINK Technology |
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