No. |
Part Name |
Description |
Manufacturer |
1 |
HT2815 |
Mini One-Sound generato |
Holt Integrated Circuits |
2 |
HT2815A |
Mini One-Sound generato |
Holt Integrated Circuits |
3 |
L-934MBD |
LOW POWER CONSUMPTION, LONG LIFE-SOLIDDTATE RELIABILITY |
Kingbright Electronic |
4 |
MLX32001EE-SO16WREEL |
Universal PSTN line interface |
Melexis |
5 |
MLX32001EE-SO16WTUBE |
Universal PSTN line interface |
Melexis |
6 |
PCI6411 |
Integrated single-socket UltraMedia PC Card controller and flash media controller |
Texas Instruments |
7 |
PCI6411GHK |
Integrated single-socket UltraMedia PC Card controller and flash media controller |
Texas Instruments |
8 |
PCI6411ZHK |
Integrated single-socket UltraMedia PC Card controller and flash media controller |
Texas Instruments |
9 |
PCI6611 |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, and flash media contr |
Texas Instruments |
10 |
PCI6611GHK |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, and flash media contr |
Texas Instruments |
11 |
PCI6611ZHK |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, and flash media contr |
Texas Instruments |
12 |
PCI7411 |
Integrated single-socket UltraMedia PC Card controller, IEEE 1394 open HCI host controller and PHY, |
Texas Instruments |
13 |
PCI7411GHK |
Integrated single-socket UltraMedia PC Card controller, IEEE 1394 open HCI host controller and PHY, |
Texas Instruments |
14 |
PCI7411ZHK |
Integrated single-socket UltraMedia PC Card controller, IEEE 1394 open HCI host controller and PHY, |
Texas Instruments |
15 |
PCI7611 |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, IEEE 1394 open HCI ho |
Texas Instruments |
16 |
PCI7611GHK |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, IEEE 1394 open HCI ho |
Texas Instruments |
17 |
PCI7611ZHK |
Integrated single-socket UltraMedia PC Card controller, Smart Card controller, IEEE 1394 open HCI ho |
Texas Instruments |
18 |
TEST-CIRCUITS |
Test circuits for Breakdown voltage and Drain-Source Current, Gate-Source Leakage Current, Drain-Source on-Resistance, etc. |
Samsung Electronic |
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