No. |
Part Name |
Description |
Manufacturer |
1 |
AB-072 |
DYNAMIC TESTS FOR A/D CONVERTER PERFORMANCE |
Burr Brown |
2 |
AN1296 |
RING WAVE TESTS WITH ACS402/ACS108 DRIVING VALVES & PUMPS |
SGS Thomson Microelectronics |
3 |
ERC |
Military/Established Reliability, MIL-R-55182 Qualified, Type RNC, Very Low Noise, Verified Failure Rate, 100% Stabilization and Screening Tests, Controlled Temperature Coefficient |
Vishay |
4 |
KSA1381ESTSSTU |
PNP Epitaxial Silicon Transistor |
Fairchild Semiconductor |
5 |
KSA1381ESTSTU |
PNP Epitaxial Silicon Transistor |
Fairchild Semiconductor |
6 |
MH8224 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
7 |
MH8228 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
8 |
MH8282 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
9 |
MH8283 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
10 |
MH8286 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11 |
MH8287 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
12 |
MH8641 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
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