No. |
Part Name |
Description |
Manufacturer |
1 |
AF100-1CG |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
2 |
AF100-1CJ |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
3 |
AF100-1CN |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
4 |
AF100-1G |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
5 |
AF100-2CG |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
6 |
AF100-2CJ |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
7 |
AF100-2CN |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
8 |
AF100-2G |
+/-18 V, 900 mW, universal active filter |
National Semiconductor |
9 |
AM29F100-1 |
1 Megabit (128 K x 8-Bit/64 K x 16-Bit) CMOS 5.0 Volt-only/ Boot Sector Flash Memory-Die Revision 1 |
Advanced Micro Devices |
10 |
AS91L1001S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
11 |
AS91L1001S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
12 |
AS91L1001S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
13 |
AS91L1001S-10F100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
14 |
AS91L1001S-40F100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test controller |
Alliance Semiconductor |
15 |
AS91L1001S-40F100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test controller |
Alliance Semiconductor |
16 |
AS91L1002S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
17 |
AS91L1002S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
18 |
AS91L1002S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
19 |
AS91L1002S-10F100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
20 |
AS91L1002S-40F100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
21 |
AS91L1002S-40F100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
22 |
AS91L1003U-10F100-C |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
23 |
AS91L1003U-10F100-CF |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
24 |
AS91L1003U-10F100-CG |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
25 |
AS91L1003U-10F100-I |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
26 |
AS91L1003U-10F100-IG |
3 to 3.6 V, 10 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
27 |
AS91L1003U-40F100-CF |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
28 |
AS91L1003U-40F100-CG |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
29 |
AS91L1003U-40F100-IF |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
30 |
AS91L1003U-40F100-IG |
3 to 3.6 V, 40 MHz TCK, 3-port JTAG test sequencer |
Alliance Semiconductor |
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