| No. |
Part Name |
Description |
Manufacturer |
| 1 |
MAX8922L |
30V Li+ Linear Battery Charger with GSM Test Mode in 3mm x 2mm TDFN |
MAXIM - Dallas Semiconductor |
| 2 |
MAX8922LETB+ |
30V Li+ Linear Battery Charger with GSM Test Mode in 3mm x 2mm TDFN |
MAXIM - Dallas Semiconductor |
| 3 |
MAX8922LETB+T |
30V Li+ Linear Battery Charger with GSM Test Mode in 3mm x 2mm TDFN |
MAXIM - Dallas Semiconductor |
| 4 |
SCANPSC110 |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 5 |
SCANPSC110F |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
Fairchild Semiconductor |
| 6 |
SCANPSC110FFMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 7 |
SCANPSC110FLMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
| 8 |
SCANSTA101 |
Low Voltage IEEE 1149.1 System Test Access (STA) Master |
Texas Instruments |
| 9 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 10 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 11 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 12 |
SCANSTA101SMX/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 13 |
TL32 |
Real Time System Testing MIT 16.070 Lecture 32 |
etc |
| | | |
