| No. |
Part Name |
Description |
Manufacturer |
| 1 |
BT8370 |
Fully Integrated T1/E1 Framer and Line Interface |
Conexant |
| 2 |
BT8370EPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 3 |
BT8370KPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 4 |
BT8375 |
Fully Integrated T1/E1 Framer and Line Interface |
Conexant |
| 5 |
BT8375EPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 6 |
BT8375KPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 7 |
BT8376 |
Fully Integrated T1/E1 Framer and Line Interface |
Conexant |
| 8 |
BT8376EPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 9 |
BT8376KPF |
single chip transceivers for T1/E1 and Integrated Service Digital Network (ISDN) primary rate interfaces |
Conexant |
| 10 |
KT837L15 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .010 inches. Aperture in front of emitter .050 inches. |
Optek Technology |
| 11 |
KT837L51 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .050 inches. Aperture in front of emitter .010 inches. |
Optek Technology |
| 12 |
KT837L55 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .050 inches. Aperture in front of emitter .050 inches. |
Optek Technology |
| 13 |
KT837W15 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .010 inches. Aperture in front of emitter .050 inches. |
Optek Technology |
| 14 |
KT837W51 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .050 inches. Aperture in front of emitter .010 inches. |
Optek Technology |
| 15 |
KT837W55 |
Slotted optical switch phototransistor output. IR transmissive polysulfone discrete shells. Electrical parameter C lead spacing .220 inches. Aperture in front of sensor .050 inches. Aperture in front of emitter .050 inches. |
Optek Technology |
| 16 |
SN54BCT8373A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 17 |
SN54BCT8373AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 18 |
SN54BCT8373AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES |
Texas Instruments |
| 19 |
SN54BCT8374A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 20 |
SN54BCT8374AFK |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 21 |
SN54BCT8374AJT |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
Texas Instruments |
| 22 |
SN74BCT8373 |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 23 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 24 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 25 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 26 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 27 |
SN74BCT8373DW |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 28 |
SN74BCT8373DWR |
Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 |
Texas Instruments |
| 29 |
SN74BCT8373NT |
Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 |
Texas Instruments |
| 30 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
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