| No. |
Part Name |
Description |
Manufacturer |
| 1 |
AB-059 |
MTTF, FAILRATE, RELIABILITY AND LIFE TESTING |
Burr Brown |
| 2 |
AB-104 |
DYNAMIC PERFORMANCE TESTING OF DIGITAL AUDIO D/A CONVERTERS |
Burr Brown |
| 3 |
AB-163 |
PARTIAL DISCHARGE TESTING: What It Is and What It Means |
Burr Brown |
| 4 |
AN011 |
Jitter Testing Procedures for Compliance with AT&T 62411 |
Cirrus Logic |
| 5 |
APPLICATION-NOTE |
Caution to be taken in measurement and testing of transistor |
NEC |
| 6 |
ERL |
Military/Established Reliability, MIL-PRF-39017 Qualified, Type RLR, Verified Failure Rate, Excellent High Frequency Performance, Epoxy Coating Provides Superior Moisture Protection, Monthly Lot Acceptance Testing, Very Low Noise |
Vishay |
| 7 |
FHV |
High Voltage, Non-Inductive Design, Matched Sets Available, Ratio Dividers Available, Special Testing Available |
Vishay |
| 8 |
PTF |
Industrial, Very Low Noise and Voltage Coefficient, Small Package, 100% Laser Spiraled, Very Good High Frequency Characteristics, Acceptance Testing Available, Can Replace Wirewound Bobbins, Superior Moisture Protection |
Vishay |
| 9 |
QUALITY |
Quality data - delivered product quality, random sample testing |
PLESSEY Semiconductors |
| 10 |
SHEAR MODULUS TESTING PATTERNS |
Special Purpose Sensors - Shear Modulus Testing |
Vishay |
| 11 |
SHEAR MODULUS TESTING PATTERNS |
Special Purpose Sensors - Shear Modulus Testing |
Vishay |
| 12 |
STEVAL-MKI013V1 |
Standard DIL 24 socket-compatible adapter board for testing the LIS302DL |
ST Microelectronics |
| 13 |
TL32 |
Real Time System Testing MIT 16.070 Lecture 32 |
etc |
| | | |
