No. |
Part Name |
Description |
Manufacturer |
1 |
AB-104 |
DYNAMIC PERFORMANCE TESTING OF DIGITAL AUDIO D/A CONVERTERS |
Burr Brown |
2 |
AN011 |
Jitter Testing Procedures for Compliance with AT&T 62411 |
Cirrus Logic |
3 |
APPLICATION-NOTE |
Caution to be taken in measurement and testing of transistor |
NEC |
4 |
FHV |
High Voltage, Non-Inductive Design, Matched Sets Available, Ratio Dividers Available, Special Testing Available |
Vishay |
5 |
PTF |
Industrial, Very Low Noise and Voltage Coefficient, Small Package, 100% Laser Spiraled, Very Good High Frequency Characteristics, Acceptance Testing Available, Can Replace Wirewound Bobbins, Superior Moisture Protection |
Vishay |
6 |
SHEAR MODULUS TESTING PATTERNS |
Special Purpose Sensors - Shear Modulus Testing |
Vishay |
7 |
STEVAL-MKI013V1 |
Standard DIL 24 socket-compatible adapter board for testing the LIS302DL |
ST Microelectronics |
8 |
TL32 |
Real Time System Testing MIT 16.070 Lecture 32 |
etc |
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