| No. |
Part Name |
Description |
Manufacturer |
| 1051 |
MH74ALS32 |
Four 2-Input OR gates |
Tesla Elektronicke |
| 1052 |
MH74ALS37 |
Four 2-Input power NAND gates |
Tesla Elektronicke |
| 1053 |
MH74ALS373 |
Eight latch flip-flops |
Tesla Elektronicke |
| 1054 |
MH74ALS374 |
Eight D flip-flops |
Tesla Elektronicke |
| 1055 |
MH74ALS38 |
Four 2-Input open collector power NAND gates |
Tesla Elektronicke |
| 1056 |
MH74ALS40 |
Two 4-Input power NAND gates |
Tesla Elektronicke |
| 1057 |
MH74ALS74 |
Two D Flip-Flops |
Tesla Elektronicke |
| 1058 |
MH74ALS86 |
Four exclusive-OR gates |
Tesla Elektronicke |
| 1059 |
MH74S187 |
Bipolar MASK programmed ROM 256 x 4 |
Tesla Elektronicke |
| 1060 |
MH74S187 |
1024 bit mask programmed ROM |
Tesla Elektronicke |
| 1061 |
MH74S201 |
RAM memory 256 bits |
Tesla Elektronicke |
| 1062 |
MH74S201E |
RAM memory 256 bits |
Tesla Elektronicke |
| 1063 |
MH74S287 |
Bipolar PROM 256 x 4 |
Tesla Elektronicke |
| 1064 |
MH74S287 |
Entering the contents of the PROM memory |
Tesla Elektronicke |
| 1065 |
MH74S287 |
Programmable memory PROM 256 bits |
Tesla Elektronicke |
| 1066 |
MH74S370 |
Bipolar MASK programmed ROM 512 x 4 |
Tesla Elektronicke |
| 1067 |
MH74S571 |
Programmable memory PROM 2048 bits |
Tesla Elektronicke |
| 1068 |
MH74S571 |
Entering the contents of the PROM memory |
Tesla Elektronicke |
| 1069 |
MH8224 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1070 |
MH8224 |
Clock and excitation circuit |
Tesla Elektronicke |
| 1071 |
MH8228 |
System control circuit, bus driver |
Tesla Elektronicke |
| 1072 |
MH8228 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1073 |
MH8282 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1074 |
MH8283 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1075 |
MH8286 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1076 |
MH8287 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1077 |
MH82S11 |
RAM 1024 bits |
Tesla Elektronicke |
| 1078 |
MH8641 |
Quad bus driver/receiver |
Tesla Elektronicke |
| 1079 |
MH8641 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
| 1080 |
MH93425 |
RAM memory 1 Kbit |
Tesla Elektronicke |
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