| No. |
Part Name |
Description |
Manufacturer |
| 11341 |
STEVAL-ILL066V1 |
100 W LED street lighting evaluation board using STLUX385A |
ST Microelectronics |
| 11342 |
STEVAL-ISA030V1 |
6 W 3-phase SMPS for metering evaluation board based on ESBT� |
ST Microelectronics |
| 11343 |
STEVAL-ISA146V1 |
4 A step-down switching evaluation board based on the ST1S50 |
ST Microelectronics |
| 11344 |
STEVAL-ISQ014V1 |
Low-side current sensing evaluation board based on the TSZ121 op amp |
ST Microelectronics |
| 11345 |
STEVAL-ISV021V1 |
Energy harvesting Evaluation kit based on the SPV1050 |
ST Microelectronics |
| 11346 |
STM8T141 |
Single-channel capacitive sensor for touch or proximity detection with shielded sensing electrode |
ST Microelectronics |
| 11347 |
STM8T141AM61T |
Single-channel capacitive sensor for touch or proximity detection with shielded sensing electrode |
ST Microelectronics |
| 11348 |
STM8T141AM61TTR |
Single-channel capacitive sensor for touch or proximity detection with shielded sensing electrode |
ST Microelectronics |
| 11349 |
STM8T141AU61T |
Single-channel capacitive sensor for touch or proximity detection with shielded sensing electrode |
ST Microelectronics |
| 11350 |
STRS6309 |
Only CIRCUIT INTEGRE |
Samsung Electronic |
| 11351 |
SY604 |
125 MHz Trigger PROGRAMMABLE TIMING EDGE VERNIER |
Micrel Semiconductor |
| 11352 |
SY605 |
125 MHz WRITE PROGRAMMABLE TIMING EDGE VERNIER |
Micrel Semiconductor |
| 11353 |
TB8235 |
8-BIT CMOS MICROCONTROLLERS USERS MANUAL |
Samsung Electronic |
| 11354 |
TB8238 |
8-BIT CMOS MICROCONTROLLERS USERS MANUAL |
Samsung Electronic |
| 11355 |
TB9228 |
8-BIT CMOS MICROCONTROLLERS USERS MANUAL |
Samsung Electronic |
| 11356 |
TC74 |
The TC74 is a serially accessible digital temperature sensor particularly suited for low cost and small form-factor applications. Temperature data is converted from the on-board thermal sensing element and made available as an 8-bit digita |
Microchip |
| 11357 |
TC77 |
The TC77 is a serially accessible digital temperature sensor particularly suited for low cost and small form-factor applications. Temperature data is converted from the on-board thermal sensing element and made available at anytime as a 13 |
Microchip |
| 11358 |
TCDT1101 |
Optoelectronic coupling element (Optocoupler) |
TELEFUNKEN |
| 11359 |
TCDT1101G |
Optoelectronic coupling element (Optocoupler) |
TELEFUNKEN |
| 11360 |
TCDT1110 |
Optoelectronic coupling element (Optocoupler) |
TELEFUNKEN |
| 11361 |
TDA4303 |
White processing encoder |
Philips |
| 11362 |
TEST-CIRCUITS |
Test circuits for Breakdown voltage and Drain-Source Current, Gate-Source Leakage Current, Drain-Source on-Resistance, etc. |
Samsung Electronic |
| 11363 |
TIP100 |
60 V, 8 A, NPN epitaxial silicon darlington transistor |
Samsung Electronic |
| 11364 |
TIP101 |
80 V, 8 A, NPN epitaxial silicon darlington transistor |
Samsung Electronic |
| 11365 |
TIP102 |
100 V, 8 A, NPN epitaxial silicon darlington transistor |
Samsung Electronic |
| 11366 |
TIP105 |
PNP (HIGH DC CURRENT GAIN MIN |
Samsung Electronic |
| 11367 |
TIP106 |
-80 V, -8 A, PNP epitaxial silicon darlington transistor |
Samsung Electronic |
| 11368 |
TIP107 |
-100 V, -8 A, PNP epitaxial silicon darlington transistor |
Samsung Electronic |
| 11369 |
TIP110 |
60 V, 2 A, NPN epitaxial silicon darlington transistor |
Samsung Electronic |
| 11370 |
TIP111 |
80 V, 2 A, NPN epitaxial silicon darlington transistor |
Samsung Electronic |
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