No. |
Part Name |
Description |
Manufacturer |
11581 |
SAK-C167CS-4R33M |
16-Bit Single-Chip Microcontroller |
Infineon |
11582 |
SAK-C167CS-4RM |
16-Bit Single-Chip Microcontroller |
Infineon |
11583 |
SAK-C167CS-L33M |
16-Bit Single-Chip Microcontroller |
Infineon |
11584 |
SAK-C167CS-LM |
16-Bit Single-Chip Microcontroller |
Infineon |
11585 |
SAK-C504 |
8-Bit Single-Chip Microcontroller |
Infineon |
11586 |
SAK-C505CA-4RC |
8-bit Single-Chip Microcontroller (Bare Die Delivery) |
Infineon |
11587 |
SAK-C505CA-LC |
8-bit Single-Chip Microcontroller (Bare Die Delivery) |
Infineon |
11588 |
SAM87RC FAMILY |
8-Bit Single-Chip CMOS Microcontrollers |
Samsung Electronic |
11589 |
SAM87RI PRODUCT FAMILY |
8-Bit Single-Chip CMOS Microcontrollers |
Samsung Electronic |
11590 |
SAM87RI PRODUCT FAMILY |
8-Bit Single-Chip CMOS Microcontrollers |
Samsung Electronic |
11591 |
SAM87RI PRODUCT FAMILY |
8-Bit Single-Chip CMOS Microcontrollers |
Samsung Electronic |
11592 |
SAM88RCRI PRODUCT FAMILY |
8-Bit Single-Chip CMOS Microcontrollers |
Samsung Electronic |
11593 |
SCAN921023 |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
11594 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11595 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
11596 |
SCAN921023SLC/NOPB |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
11597 |
SCAN921023SLCX |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11598 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11599 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
11600 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11601 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
11602 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
11603 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11604 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
11605 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11606 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
11607 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
11608 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
11609 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
11610 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
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