No. |
Part Name |
Description |
Manufacturer |
11641 |
M5310 |
JIGH RELIABILITY CURRENT REGULATOR DIODES |
Microsemi |
11642 |
M5311 |
JIGH RELIABILITY CURRENT REGULATOR DIODES |
Microsemi |
11643 |
M5312 |
JIGH RELIABILITY CURRENT REGULATOR DIODES |
Microsemi |
11644 |
M5313 |
JIGH RELIABILITY CURRENT REGULATOR DIODES |
Microsemi |
11645 |
M5314 |
JIGH RELIABILITY CURRENT REGULATOR DIODES |
Microsemi |
11646 |
MAX2055EUP |
RELIABILITY REPORT FOR MAX2055EUP PLASTIC ENCAPSULATED DEVICES |
MAXIM - Dallas Semiconductor |
11647 |
MAX5026EUT |
RELIABILITY REPORT FOR MAX5026EUT PLASTIC ENCAPSULATED DEVICES |
MAXIM - Dallas Semiconductor |
11648 |
MAX8555 |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11649 |
MAX8555A |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11650 |
MAX8555AETB |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11651 |
MAX8555AETB+ |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11652 |
MAX8555AEUB |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11653 |
MAX8555AEUB+ |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11654 |
MAX8555AEUB+T |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11655 |
MAX8555AEUB-T |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11656 |
MAX8555ETB |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11657 |
MAX8555EUB |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11658 |
MAX8555EUB+ |
Low-Cost, High-Reliability, 0.5V to 3.3V ORing MOSFET Controllers |
MAXIM - Dallas Semiconductor |
11659 |
MCT4R |
RELIABILITY CONDITIONED HERMETIC PHOTOTRANSISTOR OPTOCOUPLER |
Fairchild Semiconductor |
11660 |
MH8224 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11661 |
MH8228 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11662 |
MH8282 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11663 |
MH8283 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11664 |
MH8286 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11665 |
MH8287 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11666 |
MH8641 |
Design, mechanical and climatic requirements, Reliability, acceptance tests |
Tesla Elektronicke |
11667 |
MIL-PRF-55681 (CDR) |
Multilayer Ceramic Chip Capacitors, Qualified to MIL-C-55681, High Reliability |
Vishay |
11668 |
MILITARY PRODUCT |
High-Reliability/Military Products |
Intersil |
11669 |
ML46580S-992 |
High reliability semiconductor-beam lead gallium arsenide tuning varactor diode |
MA-Com |
11670 |
ML46580S-992 |
High Reliability Semiconductor . Beam Lead Gallium Arsenide Tuning Varactor Diode |
Tyco Electronics |
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