| No. |
Part Name |
Description |
Manufacturer |
| 12091 |
SN74BCT374 |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12092 |
SN74BCT374DB |
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 12093 |
SN74BCT374DBLE |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12094 |
SN74BCT374DBR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12095 |
SN74BCT374DW |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12096 |
SN74BCT374DWR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12097 |
SN74BCT374N |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12098 |
SN74BCT374NE4 |
Octal D-Type Edge-Triggered Flip-Flops 20-PDIP 0 to 70 |
Texas Instruments |
| 12099 |
SN74BCT374NSR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12100 |
SN74BCT534 |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
| 12101 |
SN74BCT534DW |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
| 12102 |
SN74BCT534DWR |
Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 |
Texas Instruments |
| 12103 |
SN74BCT534N |
Octal D-Type Edge-Triggered Flip-Flops 20-PDIP 0 to 70 |
Texas Instruments |
| 12104 |
SN74BCT574 |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12105 |
SN74BCT574DBR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12106 |
SN74BCT574DW |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12107 |
SN74BCT574DWR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12108 |
SN74BCT574N |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12109 |
SN74BCT574NSR |
Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12110 |
SN74BCT8374A |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12111 |
SN74BCT8374ADW |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12112 |
SN74BCT8374ADWR |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12113 |
SN74BCT8374ANT |
Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops |
Texas Instruments |
| 12114 |
SN74F109 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
| 12115 |
SN74F109D |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
| 12116 |
SN74F109DR |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
| 12117 |
SN74F109DRE4 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset 16-SOIC 0 to 70 |
Texas Instruments |
| 12118 |
SN74F109DRG4 |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset 16-SOIC 0 to 70 |
Texas Instruments |
| 12119 |
SN74F109N |
Dual J-K Positive-Edge-Triggered Flip-Flops With Clear And Preset |
Texas Instruments |
| 12120 |
SN74F112 |
Dual J-K Negative-Edge-Triggered Flip-Flop With Clear And Preset |
Texas Instruments |
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