No. |
Part Name |
Description |
Manufacturer |
121 |
NTE5655 |
TRIAC - 800mA Sensitive Gate |
NTE Electronics |
122 |
NTE5657 |
TRIAC - 800mA Sensitive Gate |
NTE Electronics |
123 |
NTE5699 |
TRIAC - 800VRM, 25A TO220 Full Pack |
NTE Electronics |
124 |
PH1214-80M |
Radar Pulsed Power Transistor - 80 Watts, 1.20-1.40 GHz, 150ms Pulse, 10% Duty |
Tyco Electronics |
125 |
PTRA083818NF-V1 |
High Power RF LDMOS FET 275W, 48V, 733 - 805 MHz |
Wolfspeed |
126 |
PTRA087008NB-V1 |
High Power RF LDMOS FET 650W, 48V, 755 - 805 MHz |
Wolfspeed |
127 |
PTVA042502EC/FC-V1 |
High Power RF LDMOS FETs 250W, 50V, 470 - 806 MHz |
Wolfspeed |
128 |
PTVA047002EV-V1 |
High Power RF LDMOS FET 700W, 50V, 470 - 806 MHz |
Wolfspeed |
129 |
PTVA084007NF-V1 |
High Power RF LDMOS FET 370W, 48V, 755 - 805 MHz |
Wolfspeed |
130 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
131 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
132 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
133 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
134 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
135 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
136 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
137 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
138 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
139 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
140 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
141 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
142 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
143 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
144 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
145 |
SCAN921226SLC |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
146 |
SCAN921226SLCX |
30MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
147 |
STB130NS04ZB |
N-CHANNEL CLAMPED - 8mOhm - 80A TO-220/TO-247 FULLY PROTECTED MESH OVERLAY MOSFET |
ST Microelectronics |
148 |
STB130NS04ZBT4 |
N-CHANNEL CLAMPED - 8mOhm - 80A TO-220/TO-247 FULLY PROTECTED MESH OVERLAY MOSFET |
ST Microelectronics |
149 |
STB140NF55 |
N-CHANNEL 55V - 0.0065& - 80A TO-220/DPAK STripFET II POWER MOSFET |
ST Microelectronics |
150 |
STB140NF55-1 |
N-CHANNEL 55V - 0.0065& - 80A TO-220/DPAK STripFET II POWER MOSFET |
ST Microelectronics |
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