| No. |
Part Name |
Description |
Manufacturer |
| 121 |
MI-QC2MW-MSY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 122 |
MI-QC2MW-MUY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 123 |
MI-QC2MW-MVY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 124 |
MI-QC2MW-MWY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 125 |
MI-QC2MW-MXY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 126 |
MI-QC2MW-MYY |
Military DC-DC Power Supplies |
Vicor Corporation |
| 127 |
MM5452MWC |
Liquid Crystal Display Drivers |
National Semiconductor |
| 128 |
MNDS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 129 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 130 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 131 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 132 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 133 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 134 |
NDHU200APAE2 |
2mW; 5V; 70mA blue laser diode |
NICHIA CORPORATION |
| 135 |
P2750 |
0.2mW; allowable current:6mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 136 |
P2750-06 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 137 |
P2750-08 |
0.2mW; allowable current:6mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 138 |
P3257-30 |
0.2mW; allowable current:50mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 139 |
P3257-31 |
0.2mW; allowable current:50mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 140 |
P3981 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 141 |
P3981-01 |
0.2mW; allowable current:3mA; MCT photoconductive detector: non-cooled type and TE-cooled suitable for long, continuous operation |
Hamamatsu Corporation |
| 142 |
PAL16L8A-2MW |
STANDARD HIGH-SPEED PAL CIRCUITS |
Texas Instruments |
| 143 |
PAL16L8A-2MWB |
2M - Standard High-Speed PAL<R> Circuits |
Texas Instruments |
| 144 |
PAL16R4A-2MW |
STANDARD HIGH-SPEED PAL CIRCUITS |
Texas Instruments |
| 145 |
PAL16R4A-2MWB |
2M - Standard High-Speed PAL<R> Circuits |
Texas Instruments |
| 146 |
PAL16R6A-2MW |
STANDARD HIGH-SPEED PAL CIRCUITS |
Texas Instruments |
| 147 |
PAL16R6A-2MWB |
2M - Standard High-Speed PAL<R> Circuits |
Texas Instruments |
| 148 |
PAL16R8A-2MW |
STANDARD HIGH-SPEED PAL CIRCUITS |
Texas Instruments |
| 149 |
PAL16R8A-2MWB |
2M - Standard High-Speed PAL<R> Circuits |
Texas Instruments |
| 150 |
RD12MW |
ZENER DIODES 200 mW 3-PIN MINI MOLD |
NEC |
| | | |
