| No. |
Part Name |
Description |
Manufacturer |
| 121 |
5962-8853401FA(54ACT109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 122 |
5962-8853401FA(54ACT109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 123 |
5962-89551012A |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 124 |
5962-89551012A(54AC109LMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 125 |
5962-89551012A(54AC109LMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 126 |
5962-8955101EA |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 127 |
5962-8955101EA(54AC109DMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 128 |
5962-8955101EA(54AC109DMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 129 |
5962-8955101FA |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 130 |
5962-8955101FA(54AC109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 131 |
5962-8955101FA(54AC109FMQB) |
Dual JK Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 132 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 133 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 134 |
5962-9202501MXA |
16-Bit D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 135 |
5962-9677301Q2A |
Octal D-type Edge-Triggered Flip-Flops with 3-State Outputs |
Texas Instruments |
| 136 |
5962-9677301QSA |
Octal D-type Edge-Triggered Flip-Flops with 3-State Outputs |
Texas Instruments |
| 137 |
5962-9686501Q2A |
Octal D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 138 |
5962-9686501QRA |
Octal D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 139 |
5962-9686501QSA |
Octal D-type Edge-Triggered Flip-Flops With 3-State Outputs |
Texas Instruments |
| 140 |
5962-9754901QKA |
OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS |
Texas Instruments |
| 141 |
5962-9758001Q2A |
Dual J-K Positive-Edge-Triggered Flip-Flops W/Clear And Preset |
Texas Instruments |
| 142 |
5962-9758001QEA |
Dual J-K Positive-Edge-Triggered Flip-Flops W/Clear And Preset |
Texas Instruments |
| 143 |
5962-9758001QFA |
Dual J-K Positive-Edge-Triggered Flip-Flops W/Clear And Preset |
Texas Instruments |
| 144 |
5962R8752501B2A |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 145 |
5962R8752501B2A |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 146 |
5962R8752501BCA |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 147 |
5962R8752501BCA |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 148 |
5962R8752501BDA |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 149 |
5962R8752501BDA |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| 150 |
5962R8752501S2A |
Dual D-Type Positive Edge-Triggered Flip-Flop |
National Semiconductor |
| | | |
