| No. |
Part Name |
Description |
Manufacturer |
| 121 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 122 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 123 |
SCANSTA101SMX/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
| 124 |
STA400EP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
| 125 |
STA400MTEP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
| 126 |
STV2145 |
I 2 C BUS CONTROLLED EAST-WEST AND VERTICAL INTERFACE |
SGS Thomson Microelectronics |
| 127 |
STV2145 |
I2C BUS CONTROLLED EAST-WEST AND VERTICAL INTERFACE |
ST Microelectronics |
| 128 |
TDA8358 |
Full bridge vertical deflection output circuit in LVDMOS with east-west amplifier |
Philips |
| 129 |
TDA8358J |
Full bridge vertical deflection output circuit in LVDMOS with east-west amplifier |
Philips |
| 130 |
TDA8358J/N2 |
TDA8358J; Full bridge vertical deflection output circuit in LVDMOS with east-west amplifier |
Philips |
| 131 |
TDA8358J_N1 |
Full bridge vertical deflection output circuit in LVDMOS with east-west amplifier |
Philips |
| 132 |
TS83102G0BMGS |
This latest A/D converter is a thermally enhanced, pin-to-pin compatible version of the high-speed TS83102G0B ADC and is designed ... |
Atmel |
| | | |
