No. |
Part Name |
Description |
Manufacturer |
121 |
ADM1086AKS-REEL7 |
Power Supply Sequencing Solution: ADM1086 Simple Sequencer™ |
Analog Devices |
122 |
ADM1086AKS-U1 |
Power Supply Sequencing Solution: ADM1086 Simple Sequencer™ |
Analog Devices |
123 |
ADM1087 |
Power Supply Sequencing Solution: ADM1087 Simple Sequencer™ |
Analog Devices |
124 |
ADM1087AKS-REEL7 |
Power Supply Sequencing Solution: ADM1087 Simple Sequencer™ |
Analog Devices |
125 |
ADM1087AKSZ-REEL7 |
Power Supply Sequencing Solution: ADM1087 Simple Sequencer™ |
Analog Devices |
126 |
ADM1088 |
Power Supply Sequencing Solution: ADM1088 Simple Sequencer™ |
Analog Devices |
127 |
ADM1088AKS-REEL7 |
Power Supply Sequencing Solution: ADM1088 Simple Sequencer™ |
Analog Devices |
128 |
ADM1166 |
Super Sequencer with Margining Control and Non-Volatile Fault Recording |
Analog Devices |
129 |
ADM1168 |
Super Sequencer and Monitor with Nonvolatile Fault Recording |
Analog Devices |
130 |
ADM1169 |
Super Sequencer and Monitor with Margining Control and Non-Volatile Fault Recording |
Analog Devices |
131 |
ADM1185 |
Quad Voltage Monitor and Sequencer |
Analog Devices |
132 |
ADM1186 |
Quad Voltage Sequencer and Monitor with Programmable Timing |
Analog Devices |
133 |
ADM6819 |
FET Drive Simple Sequencer™ w/Fixed 200ms Delay |
Analog Devices |
134 |
ADM6820 |
FET Drive Simple Sequencer™ w/Capacitor Adjustable Delay |
Analog Devices |
135 |
AM29112 |
High Performance 8 Bit Slice Microprogram Sequencer |
Advanced Micro Devices |
136 |
AM2911A |
Microprogram Sequencers |
Advanced Micro Devices |
137 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
138 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
139 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
140 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
141 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
142 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
143 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
144 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
145 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
146 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
147 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
148 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
149 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
150 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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