No. |
Part Name |
Description |
Manufacturer |
121 |
AECS-1010-AA02 |
AECS-1010-AA02 · Reflective Color Sensor Application Kit |
Agilent (Hewlett-Packard) |
122 |
AECS-1010-AA02 |
AECS-1010-AA02 · Reflective Color Sensor Application Kit |
Agilent (Hewlett-Packard) |
123 |
AS91L1001S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
124 |
AS91L1001S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
125 |
AS91L1001S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
126 |
AS91L1001S-10F100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test controller |
Alliance Semiconductor |
127 |
AS91L1001S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
128 |
AS91L1001S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
129 |
AS91L1001S-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
130 |
AS91L1001S-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
131 |
AS91L1001S-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
132 |
AS91L1001S-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
133 |
AS91L1002S-10F100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
134 |
AS91L1002S-10F100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
135 |
AS91L1002S-10F100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
136 |
AS91L1002S-10F100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
137 |
AS91L1002S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
138 |
AS91L1002S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
139 |
AS91L1002S-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
140 |
AS91L1002S-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
141 |
AS91L1002S-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
142 |
AS91L1002S-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
143 |
AS91L1003S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
144 |
AS91L1003S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
145 |
AS91L1003S-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
146 |
AS91L1003S-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
147 |
AS91L1003S-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
148 |
AS91L1003S-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
149 |
AS91L1006S-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
150 |
AS91L1006S-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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