| No. |
Part Name |
Description |
Manufacturer |
| 1381 |
DS26F32MER-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1382 |
DS26F32MJ-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1383 |
DS26F32MJR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1384 |
DS26F32MJRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1385 |
DS26F32MW-QMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1386 |
DS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1387 |
DS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1388 |
DS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1389 |
DS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
| 1390 |
DS3875 |
FutureBus Plus Arbitration Controller - MIL-STD-883 |
National Semiconductor |
| 1391 |
DS3875VX |
FutureBus Plus Arbitration Controller - MIL-STD-883 |
National Semiconductor |
| 1392 |
DS3884A-MIL |
BTL Handshake Transceiver - MIL-STD-883 |
National Semiconductor |
| 1393 |
DS3885 |
BTL Arbitration Transceiver - MIL-STD-883 |
National Semiconductor |
| 1394 |
DS3885VX |
BTL Arbitration Transceiver - MIL-STD-883 |
National Semiconductor |
| 1395 |
EDI84258CS |
+ 5V (+/-10%), 126K x 4 monolithic CMOS static RAM commercial and military |
White Electronic Designs |
| 1396 |
EDI84258LPS |
+ 5V (+/-10%), 126K x 4 monolithic CMOS static RAM commercial and military |
White Electronic Designs |
| 1397 |
EDI84258PS |
+ 5V (+/-10%), 126K x 4 monolithic CMOS static RAM commercial and military |
White Electronic Designs |
| 1398 |
EGS/W/N |
Military/Established Reliability, MIL-R-39007 Qual., Type RWR, R Level, Meets Solvent Resistance of MIL-STD-202 (Method 215), 100% Power Stabilization and Screening Test |
Vishay |
| 1399 |
EGS/W/N |
Military/Established Reliability, MIL-R-39007 Qual., Type RWR, R Level, Meets Solvent Resistance of MIL-STD-202 (Method 215), 100% Power Stabilization and Screening Test |
Vishay |
| 1400 |
ENH |
Military/Established Reliability, MIL-R-39009 Qualified, Type RER, R Level, Aluminum Housed, Standard (ERH) or Non-inductive (ENH) Winding, Complete Environmental Protection |
Vishay |
| 1401 |
ERC |
Military/Established Reliability, MIL-R-55182 Qualified, Type RNC, Very Low Noise, Verified Failure Rate, 100% Stabilization and Screening Tests, Controlled Temperature Coefficient |
Vishay |
| 1402 |
ERH |
Military/Established Reliability, MIL-R-39009 Qualified, Type RER, R Level, Aluminum Housed, Standard (ERH) or Non-inductive (ENH) Winding, Complete Environmental Protection |
Vishay |
| 1403 |
ERL |
Military/Established Reliability, MIL-PRF-39017 Qualified, Type RLR, Verified Failure Rate, Excellent High Frequency Performance, Epoxy Coating Provides Superior Moisture Protection, Monthly Lot Acceptance Testing, Very Low Noise |
Vishay |
| 1404 |
ESS/W/N |
Military/Established Reliability, MIL-R-39007 Qual., Type RWR, R Level, Meets Solvent Resistance of MIL-STD-202 (Method 215), 100% Power Stabilization and Screening Test |
Vishay |
| 1405 |
ESS/W/N |
Military/Established Reliability, MIL-R-39007 Qual., Type RWR, R Level, Meets Solvent Resistance of MIL-STD-202 (Method 215), 100% Power Stabilization and Screening Test |
Vishay |
| 1406 |
E_H |
QPL Wraparound Thin Film, MIL-R-55342 Characteristic E & H |
Vishay |
| 1407 |
FDB20AN06A0 |
N-Channel PowerTrench MOSFET 60V, 45A, 20 milliohm |
Fairchild Semiconductor |
| 1408 |
FDB20AN06A0_NL |
N-Channel PowerTrench MOSFET 60V, 45A, 20 milliohm |
Fairchild Semiconductor |
| 1409 |
FOD8318 |
2.5 A Output Current, IGBT Drive Optocoupler With Active Miller Clamp, Desaturation Detection and Isolated Fault Sensing |
Fairchild Semiconductor |
| 1410 |
FOD8332 |
Input LED Drive, 2.5 A Output Current, IGBT Drive Optocoupler with Desaturation Detection, Isolated Fault Sensing, and Active Miller Clamp |
Fairchild Semiconductor |
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